» Papers

Presentation at the 1995 Southern California conference on undergraduate research: Real time simultaneous opticalbased flux monitoring of molecular beam fluxes during epitaxial growth. Paul Pinsukanjana, Andrew Jackson, Jan Tofte, Kevin Maranowski, Scott Campbell, John English, Scott Chalmers, and Arthur Gossard "Real-time simultaneous optical-based flux monitoring of Al, Ga, and In using atomic absorption for molecular beam epitaxy," Journal of American Vacuum Society, Vol. 14, No. 3, May/June 1996. Paper - 4 pages, 72KB Jan Arild Tofte, Chee Kian Ong, Jiun Lang Huang, and Kwang Ting (Tim) Cheng "Characterization of a Pseudo-Random Testing Technique for Analog and Mixed-Signal Built-In-Self-Test," Proceedings of IEEE VLSI Test Symposium, Montreal, Canada, pp. 237-246, May 2000. Paper - 10 pages, 333KB Slides - 18 pages, 114KB (Slightly more inclusive than what I presented at VTS) Xinli Gu, Jan A. Tofte, Sung Soo Chung, Frank Tsang, Hamid Rahmanian "A Fast Timing Closure Technique for Industrial use of Logic BIST," IEEE European Test Workshop, Stockholm, Sweden, May 2001. Slides - 12 pages, 983KB Xinli Gu, Jan A. Tofte, Sung Soo Chung, Frank Tsang, Hamid Rahmanian "An effort-minimized logic BIST implementation method" Proceedings of IEEE International Test Conference, Baltimore, MA, pp.1002-1010, October 2001. Paper - 9 pages, 142KB Slides - 22 pages, 68KB Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan A. Tofte, Mark Kassab, Janusz Rajski "Realizing high test quality goals with smart test resource usage" Proceedings of IEEE International Test Conference, Charlotte, NC, pp.525-533, October 2004. Paper - 9 pages, 301KB Slides - 17 pages, 319KB Jayanth Mekkoth, Murali Krishna, Jun Qian, Nagesh Tamarapalli, Wu-Tung Cheng, Jan Tofte, Martin Keim "Yield Learning with Layout-aware Advanced Scan Diagnosis" Proceedings of the International Symposium for Testing and Failure Analysis, Austin, TX, pp.412-418, November 2006. Paper - 6 pages, 97KB Slides - 21 pages, 934KB

» Patents

U.S. Patent 5,936,716: "Method of controlling multi-species epitaxial deposition.", August 10, 1999. Patent document - 41 pages, 2.7MB U.S. Patent 6,038,017: "Method of controlling multi-species epitaxial deposition.", March 14, 2000. Patent document - 35 pages, 2.0MB U.S. Patent 6,075,558: "Integrated multi-channel optical-based flux monitor and method", June 13, 2000. Patent document - 22 pages, 1.3MB

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